一、概要:
可控硅选件是安装在 DTS-1000 测试主机里面的一块扩展卡, 用于测试可控硅器件产 品的专用控制板卡, 用于测试单、双向可控硅产品的直流参数。
二、测试项目表:
● Thyristor & Triac
|
Test Item
|
ITEMNAME
|
Measurement Range &Accuracy
|
Forcing Range &Accuracy
|
|
Leakage
Current
|
IDRM(S , R)
IRRM
|
000.0pA~9.999mA
000.0pA~9.999nA ±2%+10pA
00.00nA~99.99nA ±1%+2digit
000.0nA~999.9mA ±0.5%+2digit
|
HV:1.00V~999.9V ±0.5%+20mV
|
|
Breakdown
Voltage
|
VDRM(S , R)
VRRM
VRGM
|
0.000V~999.9V ±0.5%+2digit
|
Current:100nA~50.0mA ±0.5%+3nA
VMAX:000V~999.9V ±10%+2V
|
|
Forward
Voltage
|
VFGM
|
00.00mV~20.00V ±0.5%+2mV
|
Current:100nA~20.0A ±0.5%+3nA
|
|
On Voltage
|
VTM
|
00.00mV~20.00V ±0.5%+2mV
|
IT:100nA~20.0A ±0.5%+3nA
IG:00.0nA~99.9mA ±0.5%+3nA
|
|
Gate
Trigger Current
|
IGT1 (T+ ,G+)
IGT2 (T+ , G-) IGT3 (T- , G-) IGT4 (T- , G+)
|
0.000uA ~ 9.999A ± 1.0 % +
2digit
ON Voltage Value: ±0.01~9.99V
|
100mV~40.00V ±0.5%+2mV
RL: (*1)
|
|
Gate
Trigger Voltage
|
VGT1 (T+ , G+)
VGT2 (T+ , G-)
VGT3 (T- , G-) VGT4 (T- , G+)
|
000.0mV~20.00V ±1.0%+2mV
ON Voltage Value: ±0.01~9.99V
|
100mV~40.00V ±0.5%+2mV
RL: (*1)
|
|
Holding Current
|
IH
|
0.000mV~99.99mA ±1.0%+2digit
ON Voltage Value: ±0.01~9.99V
|
IT:000mA~20.0A ±0.5%+3nA
IG:00.0mA~99.9mA ±0.5%+3nA
|
|
Gate
Non Trigger
Voltage
|
VGD
|
000.0mV~20.00V ±1.0%+2mV
ON Voltage Value: ±001~999V
|
HV: VAK
001V~ 999V ± 0.5%+20mV
|
|
Holding
Current
|
IHV
IHV3
|
0.000uA~99.99mA ±1.0%+2digit
ON Voltage Value: ±0.01~9.99V
|
VAK :100mV~ 30.0V ± 5.0%+2mV
IG :00.0mA~ 99.9mA ± 5.0%+3nA
RL: (*1)
|
|
Breakover
Voltage
|
VBOL
|
0.000V~999.9V ±1.0%+2digit
|
Current: IAK
100nA ~ 50.0mA 0.5%+3nA
|
|
Latching
Current
|
ILATCH1 ILATCH2 ILATCH3 ILATCH4
|
0.000uA~999.9mA ±1.0%+2digit
ON Voltage Value: ±0.01~9.99V
|
IG:0.00mA~ 99.9mA ±5.0%+3nA
|
|
Leakage
current
|
IKG
|
000.0pA~9.999mA
000.0pA~9.999nA ±2%+10PA
00.00nA~99.99nA ±1%+2digit
000.0nA~9.999mA ±0.5%+2digit
|
HV:1.00V~ 999V ±0.5%+20mV
|
*1: RL 电阻需要在测试站内添加 (RL needs to attach in Test Head)。
